XY Scanning Slit Beam Profiler

Description
Specifications

XY Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0

Features

190 to 1150 nm, Silicon detector
650 to 1800 nm, InGaAs detector
1000 to 2300 or 2500 nm, InGaAs (extended) detector
Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
Port-powered USB 2.0; flexible 3 m cable; no power brick
0.1 µm sampling and resolution
Linear & log X-Y profiles, centroid
Profile zoom & slit width compensation
Economical and accurate
M² option – beam propagation analysis, divergence, focus

Applications

Laser printing & marking
Medical lasers
Diode laser systems
Fibre optic telecom assembly focusing –
LensPlate2™ option for re-imaging waveguides and fibre ends
Development, production, field service
CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
M² measurement with available M2DU stage

Wavelength	Si detector: 190 to 1150 nm InGaAs detector: 650 to 1800 nm Si + InGaAs detectors: 190 to 1800 nm Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned Beam Diameters	Si detector: 5 µm to 4 mm‚ to 2 µm in Knife-Edge mode InGaAs detector: 10 µm to 3 mm‚ to 2 µm in Knife-Edge mode InGaAs (extended) detector: 10 µm to 2 mm‚ to 2 µm in Knife-Edge mode
Beam Waist Diameter Measurement	Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat 1/e² (13.5%) width User selectable % of peak Knife-Edge mode for very small beam
Measured Sources	CW; Pulsed lasers‚ Φ µm ≥ [500/(PRR in kHz)]
Resolution Accuracy	0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm
Maximum Power & Irradiance	1 W Total & 0.5 mW/µm²
Gain Range	1‚000:1 Switched; 4‚096:1 ADC range
Displayed Graphics	X-Y Position & Profiles‚ Zoom x1 to x16
Update Rate	~5 Hz
Pass/Fail Display	On-screen selectable Pass/Fail colors. Ideal for QA & Production.
Averaging	User selectable running average (1 to 8 samples)
Statistics	Min.‚ Max.‚ Mean‚ Standard Deviation Log data over extended periods
XY Profile & Centroid	Beam Wander display and logging
Minimum PC Requirements	Windows, 2 GB RAM, USB 2.0/3.0 port